Orientational epitaxy of a crystal-E overlayer on a hexatic-B substrate
- Author
- CHENG, M1 ; HO, J. T1 ; HUI, S. W; GOODBY, J. W; PINDAK, R; GEER, R; HUANG, C. C
[1] State univ. New York at Buffalo, dep. physics astronomy, Buffalo NY 14260, United States - Source
Physical review. A. 1991, Vol 44, Num 12, pp R7891-R7893 ; ref : 22 ref
- CODEN
- PLRAAN
- ISSN
- 1050-2947
- Scientific domain
- Optics; Atomic molecular physics; Physics
- Publisher
- American Physical Society, College Park, MD
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Couche mince Cristal liquide Diffractométrie électron Epitaxie Surface Orientation moléculaire Substrat hexatique B
- Keyword (en)
- Thin film Liquid crystals Electron diffractometry Epitaxy Surface
- Keyword (es)
- Capa fina Cristal líquido Difractometría electrón Epitaxia Superficie
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H90 Other topics in structure, and nonelectronic properties of surfaces and interfaces; thin films and whiskers
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 4350343
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1103/PhysRevA.44.R7891 
https://dx.doi.org/10.1103/PhysRevA.44.R7891
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