Characteristics of advanced YBa2Cu3Ox/PrBa2Cu3Ox/YBa2Cu3Ox edge type junctions
- Author
- GAO, J; BOGUSLAVSKIJ, Y; KLOPMAN, B. B. G; TERPSTRA, D; GERRITSMA, G. J; ROGALLA, H
Univ. Twente, dep. applied physics, Enschede 7500 AE, Netherlands - Source
Applied physics letters. 1991, Vol 59, Num 21, pp 2754-2756 ; ref : 10 ref
- CODEN
- APPLAB
- ISSN
- 0003-6951
- Scientific domain
- Crystallography; Electronics; Optics; Condensed state physics
- Publisher
- American Institute of Physics, Melville, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Champ magnétique Constante diélectrique Courant critique Densité Electrode Paramètre critique Résistivité Modulation courant
- Keyword (en)
- Magnetic field Permittivity Critical current Relative density Electrodes Critical parameter Resistivity
- Keyword (es)
- Campo magnético Constante dieléctrica Corriente crítica Densidad relativa Electrodo Parámetro crítico Resistividad
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40A Electromagnetism; electron and ion optics / 001B40A90 Other topics in electromagnetism; electron and ion optics
- Discipline
- Physics : electromagnetism
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 4387054
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1063/1.105878 
https://dx.doi.org/10.1063/1.105878
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