500 GHz GaAs MMIC sampling wafer probe
- Author
- SHAKOURI, M. S; BLACK, A; AULD, B. A; BLOOM, D. M
Stanford univ., Edward L. Ginzton lab., Stanford CA 94305, United States - Source
Electronics Letters. 1993, Vol 29, Num 6, pp 557-558 ; ref : 7 ref
- CODEN
- ELLEAK
- ISSN
- 0013-5194
- Scientific domain
- Electronics; Optics; Telecommunications
- Publisher
- Institution of Electrical Engineers, London
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Circuit hyperfréquence Circuit intégré monolithique Description système Gallium Arséniure Oscilloscope Pastille électronique Signal essai Sonde électronique Subpicoseconde
- Keyword (en)
- Microwave circuit Monolithic integrated circuit System description Gallium Arsenides Oscilloscope Wafer Test signal Electron probe Subpicosecond
- Keyword (es)
- Circuito hiperfrecuencia Circuito integrado monolítico Descripción sistema Galio Arseniuro Osciloscopio Pastilla electrónica Señal prueba Sonda electrónica Subpicosegundo
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 4668821
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1049/el:19930372 
https://dx.doi.org/10.1049/el:19930372
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