Physical properties of sprayed SnO2 films
- Author
- VASU, V; SUBRAHMANYAM, A
Indian inst. technology, dep. physics, semiconductor lab., Madras 600036, India - Source
Thin solid films. 1991, Vol 202, Num 2, pp 283-288 ; ref : 11 ref
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Scientific domain
- Crystallography; Electronics; Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier Science, Lausanne
- Publication country
- Switzerland
- Document type
- Article
- Language
- English
- Keyword (fr)
- Composé minéral Couche mince Diffraction RX Etain Oxyde Etude expérimentale Propriété optique Propriété électrique Pyrolyse Température
- Keyword (en)
- Inorganic compound Thin film X ray diffraction Tin Oxides Experimental study Optical properties Electrical properties Pyrolysis Temperature
- Keyword (es)
- Compuesto inorgánico Capa fina Difracción RX Estaño Óxido Estudio experimental Propiedad óptica Propiedad eléctrica Pirólisis Temperatura
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C50 Electronic transport phenomena in thin films and low-dimensional structures
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 5215560
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0040-6090(91)90099-J 
https://dx.doi.org/10.1016/0040-6090(91)90099-J
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