The mechanical properties of wear-resistant coatings. II: Experimental studies and interpretation of hardness
- Author
- BURNETT, P. J1 ; RICKERBY, D. S
[1] Atomic energy res. establishment Harwell, Didcot Oxon OX11 0RA, United Kingdom - Source
Thin solid films. 1987, Vol 148, Num 1, pp 51-65 ; ref : 14 ref
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Scientific domain
- Crystallography; Electronics; Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier Science, Lausanne
- Publication country
- Switzerland
- Document type
- Article
- Language
- English
- Keyword (fr)
- Adhérence Composé minéral Couche mince Dureté Etude expérimentale Microscopie électronique balayage Microstructure Métal transition Composé Placage ionique Titane Nitrure Titane Tungstène Carbure Mixte
- Keyword (en)
- Adhesion Inorganic compound Thin film Hardness Experimental study Scanning electron microscopy Microstructure Transition metal Compounds Ion plating Titanium Nitrides Titanium Tungsten Carbides Mixed
- Keyword (es)
- Adherencia Compuesto mineral Capa fina Dureza Estudio experimental Microscopía electrónica barrido Microestructura Metal transición Enchapado iónico Titanio Titanio
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H60 Physical properties of thin films, nonelectronic
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 7415099
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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