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Diffusion of native defects in (Pb1-xSnx)1-yTey during liquid phase epitaxy

Author
ALEKSANDROVA, O. A1 ; KAMCHATKA, M. I; MIROPOLSKII, M. S; PASSYNKOV, V. V
[1] V. I. Ulyanov electrical eng. inst., Leningrad 197022, Ussr
Conference name
Ion implantation in semiconductors and other materials and ion beam devices. Working meeting (1985)
Source

Physica status solidi. A. Applied research. 1986, Vol 94, Num 1, pp 139-145 ; ref : 13 ref

CODEN
PSSABA
ISSN
0031-8965
Scientific domain
Crystallography; Electronics; Metallurgy, welding; Condensed state physics
Publisher
Wiley-VCH, Berlin
Publication country
Germany
Document type
Conference Paper
Language
English
Keyword (fr)
Composé minéral Couche mince Croissance cristalline Diffusion chimique Défaut ponctuel Epitaxie Etain II Plomb «II» Tellurure Mixte Etude théorique Solution solide
Keyword (en)
Inorganic compound Thin film Crystal growth Chemical diffusion Point defect Epitaxy Tin II Lead «II» Tellurides Mixed Theoretical study Solid solution
Keyword (es)
Compuesto mineral Capa delgada Crecimiento cristalino Difusión química Defecto puntual Epitaxia Estaño II Estudio teórico Solución sólida
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H60 Physical properties of thin films, nonelectronic

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
7961855

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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