Direct measurements of the velocity and thickness of explosively propagating buried molten layers in amorphous silicon
- Author
- LOWNDES, D. H1 ; JELLISON, G. E. JR; PENNYCOOK, S. J; WITHROW, S. P; MASHBURN, D. N
[1] Oak Ridge national lab., Oak Ridge TN 37831, United States - Source
Applied physics letters. 1986, Vol 48, Num 20, pp 1389-1391 ; ref : 18 ref
- CODEN
- APPLAB
- ISSN
- 0003-6951
- Scientific domain
- Crystallography; Electronics; Optics; Condensed state physics
- Publisher
- American Institute of Physics, Melville, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Amorphisation Couche enterrée Cuivre Ion atomique Etude expérimentale Faisceau laser Fusion Implantation ion Microscopie électronique balayage transmission Non métal Rayonnement IR Rayonnement visible Réflectivité Rétrodiffusion Rutherford Silicium
- Keyword (en)
- Amorphization Buried layer Copper Atomic ions Experimental study Laser beam Melting Ion implantation Scanning transmission electron microscopy Non metal Infrared radiation Visible radiation Reflectivity Rutherford backscattering Silicon
- Keyword (es)
- Amorfización Capa enterrada Cobre Estudio experimental Haz láser Fusion Implantación ión Microscopia electronica de barrido transmision No metal Radiacion infrarroja Radiacion invisible Reflectividad Retrodifusión Rutherford Silicio
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A72 Defects and impurities in crystals; microstructure / 001B60A72V Doping and impurity implantation in iii-v and ii-vi semiconductors
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 8039143
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1063/1.96918 
https://dx.doi.org/10.1063/1.96918
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