Stress and density effects on infrared absorption spectra of silicate glass films
- Author
- NAKAMURA, M1 ; KANZAWA, R; SAKAI, K
[1] Hitachi ltd., Hitachi 319-12, Japan - Source
Journal of the Electrochemical Society. 1986, Vol 133, Num 6, pp 1167-1171 ; ref : 14 ref
- CODEN
- JESOAN
- ISSN
- 0013-4651
- Scientific domain
- General chemistry, physical chemistry; Crystallography; Electrical engineering; Condensed state physics
- Publisher
- Electrochemical Society, Pennington, NJ
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Composé minéral Contrainte interne Couche mince Densité Etude expérimentale Silicate Spectre IR Traitement thermique Verre
- Keyword (en)
- Inorganic compound Internal stress Thin film Specific gravity Experimental study Silicates Infrared spectrum Heat treatment Glass
- Keyword (es)
- Compuesto mineral Tensión interna Capa delgada Densidad Estudio experimental Silicato Espectro IR Tratamiento termico Vidrio
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H60 Physical properties of thin films, nonelectronic
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 8066574
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1149/1.2108812 
https://dx.doi.org/10.1149/1.2108812
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