0.1 ps resolution delay circuit for waveform measurement in the stroboscopic scanning electron microscope
- Author
- FUJIOKA, H1 ; KUNIZAWA, H; URA, K
[1] Osaka univ. fac. eng., electron beam lab., Osaka 565, Japan - Source
Journal of physics. E. Scientific instruments. 1986, Vol 19, Num 12, pp 1025-1026 ; ref : 4 ref
- CODEN
- JPSIAE
- ISSN
- 0022-3735
- Scientific domain
- Electronics; Physics
- Publisher
- American Institute of Physics, New York, NY
/
Institute of Physics, London
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Circuit retard Forme onde Microscopie électronique balayage Picoseconde Stroboscopie
- Keyword (en)
- Delay circuit Waveform Scanning electron microscopy Picosecond Stroboscopy
- Keyword (es)
- Circuito retardo Forma onda Microscopia electronica barrido Picosegundo Estroboscopia
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03B Testing, measurement, noise and reliability
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 8094135
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1088/0022-3735/19/12/007 
https://dx.doi.org/10.1088/0022-3735/19/12/007
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