Direct resolution and identification of the sublattices in compound semiconductors by high-resolution transmission electron microscopy
- Author
- OURMAZD, A1 ; RENTSCHLER, J. R; TAYLOR, D. W
[1] AT&T Bell Laboratories, Holmdel NJ 07733, United States - Source
Physical review letters. 1986, Vol 57, Num 24, pp 3073-3076 ; ref : 3 ref
- CODEN
- PRLTAO
- ISSN
- 0031-9007
- Scientific domain
- Optics; Atomic molecular physics; Condensed state physics; Physics; Plasma physics
- Publisher
- American Physical Society, Ridge, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D17 Other techniques and industries
- Discipline
- Generalities in applied sciences
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 8378289
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1103/PhysRevLett.57.3073 
https://dx.doi.org/10.1103/PhysRevLett.57.3073
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