THE INFLUENCE OF SUBSTRATE PROPERTIES ON MICROWAVE LOSSES IN THIN FILMS OF SEMICONDUCTORS
- Author
- COVINGTON DW; RAY DC
GEORGIA INST. TECHNOL., ATLANTA, GA., U.S.A. - Source
- SOLID-STATE ELECTRON.; G.B.; DA. 1973; VOL. 16; NO 3; PP. 301-308; BIBL. 24 REF.
- Document type
- Serial Issue
- Language
- English
- Keyword (fr)
- COUCHE MINCE MATERIAU SEMICONDUCTEUR RESISTIVITE ELECTRIQUE SUBSTRAT ISOLANT HYPERFREQUENCE PERTE ENERGIE METHODE MESURE CIRCUIT HYPERFREQUENCE CONCEPTION CIRCUIT CIRCUIT INTEGRE COUCHE MINCE CONDUCTIVITE ELECTRIQUE PROPRIETE ELECTRIQUE EFFET SUPPORT SEMICONDUCTEUR ELECTROMAGNETISME ELECTRONIQUE PHYSIQUE SOLIDE
- Keyword (en)
- ELECTROMAGNETISM ELECTRONICS SOLID PHYSICS
- Keyword (es)
- ELECTROMAGNETISMO ELECTRONICA FISICA DEL ESTADO CONDENSADO
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties
- Discipline
- Electronics Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7314510525
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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