A DEFECT PRODUCED IN LOW POWER ELECTRON MICROGRAPHS BY THIN-FOIL OBJECTIVE APERTURES.
- Author
- ROSTGAARD J
ANAT. DEP. C UNIV. COPENHAGEN, 2100 COPENHAGEN, DEN. - Source
- J. MICR.; G.B.; DA. 1974; VOL. 101; NO 3; PP. 291-297
- Document type
- Article
- Language
- English
- Keyword (fr)
- MICROSCOPIE ELECTRONIQUE IMAGE QUALITE IMAGE DEFAUT MICROGRAPHIE METROLOGIE PHYSIQUE THEORIQUE CRISTALLOGRAPHIE
- Keyword (en)
- MEASUREMENT SCIENCE THEORETICAL PHYSICS CRISTALLOGRAPHY
- Keyword (es)
- METROLOGIA FISICA TEORICA CRISTALOGRAFIA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7530064433
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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