A TECHNIQUE FOR LOCATING FAULTS IN DIGITAL CIRCUIT PACKS.
- Other title
- UNE TECHNIQUE PERMETTANT DE LOCALISER DES FAUTES DANS DES ENSEMBLES DE CIRCUITS NUMERIQUES (fr)
- Author
- HOBEN CV; NEUHAUSEL JE; TO K
- Source
- WEST. ELECTR. ENGR; U.S.A.; DA. 1976; VOL. 20; NO 3; PP. 15-23
- Document type
- Article
- Language
- English
- Keyword (fr)
- FIABILITE CIRCUIT CIRCUIT NUMERIQUE DETECTION PANNE DIAGNOSTIC PANNE INFORMATIQUE MATHEMATIQUES APPLIQUEES
- Keyword (en)
- RELIABILITY CIRCUIT DIGITAL CIRCUIT FAILURE DETECTION FAULT DIAGNOSTIC COMPUTER SCIENCES APPLIED MATHEMATICS
- Keyword (es)
- INFORMATICA MATEMATICAS APPLICADAS
- Classification
- Pascal
- 001 Exact sciences and technology / 001A Sciences and techniques of general use / 001A02 Mathematics
- Discipline
- Mathematics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7730192532
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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