A DIGITAL SCANNING AUGER ELECTRON MICROSCOPE INCORPORATING A CONCENTRIC HEMISPHERICAL ANALYSER.
- Author
- BROWNING R; BASSETT PJ; EL GOMATI MM; PRUTTON M
DEP. PHYS., UNIV. YORK, HESLINGTON, YORK Y015DD, U.K. - Source
- PROC. R. SOC. LONDON, A; G.B.; DA. 1977; VOL. 357; NO 1689; PP. 213-230; BIBL. 22 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- MICROSCOPIE ELECTRONIQUE MICROSCOPE BALAYAGE ELECTRON AUGER ANALYSEUR ENERGIE METROLOGIE PHYSIQUE THEORIQUE
- Keyword (en)
- ELECTRON MICROSCOPY SCANNING MICROSCOPE AUGER ELECTRON ENERGY ANALYZER MEASUREMENT SCIENCE THEORETICAL PHYSICS
- Keyword (es)
- METROLOGIA FISICA TEORICA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics
- Discipline
- Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7830311901
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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