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ZUM NACHWEIS VON SAUERSTOFF IN MIKROBEREICHEN VON VERSETZUNGSFREIEN CZOCHRALSKI-SILIZIUM-EINKRISTALLEN.

Other title
MISE EN EVIDENCE D'OXYGENE DANS LES MICRODOMAINES DE MONOCRISTAUX DE SILICIUM, OBTENUS PAR LA METHODE DE CZOCHRALSKI, SOUS DISLOCATIONS (fr)
Author
GAWORZEWSKI P; HAHLE S; RIEMANN H
INST. PHYS. WERKSTOFFBEARBEIT., AKAD. WISS. DDR, DDR-1166 BERLIN-RAHNSDORF
Source
KRISTALL U. TECH.; DTSCH.; DA. 1977; VOL. 12; NO 8; PP. 871-878; ABS. ANGL.; BIBL. 14 REF.
Document type
Article
Language
German
Keyword (fr)
SILICIUM CROISSANCE CRISTALLINE MONOCRISTAL METHODE CZOCHRALSKI IMPURETE CONCENTRATION IMPURETE PIQURE ATTAQUE RECUIT ETUDE EXPERIMENTALE METALLOIDE DOPAGE O CRISTALLOGRAPHIE
Keyword (en)
SILICON CRYSTAL GROWTH SINGLE CRYSTAL CZOCHRALSKI METHOD IMPURITIES IMPURITY DENSITY ANNEALING EXPERIMENTAL STUDY CRISTALLOGRAPHY
Keyword (es)
CRISTALOGRAFIA
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7840132766

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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