A DIRECT COMPARISON BETWEEN SEM(EBIC) AND HVEM IMAGES OF CRYSTAL DEFECTS IN SEMICONDUCTORS.
- Author
- BLUMTRITT H; GLEICHMANN R
INST. FESTKOERPERPHYS. ELEKTRONENMIKROSK., AKAD. WISS. DDR, 402 HALLE/SAALE, GDR - Source
- ULTRAMICROSCOPY; NETHERL.; DA. 1977; VOL. 2; NO 4; PP. 405-408; BIBL. 9 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- SEMICONDUCTEUR DEFAUT CRISTALLIN MICROSCOPIE ELECTRONIQUE MICROSCOPE BALAYAGE MICROSCOPE TRANSMISSION MICROSCOPE HAUTE TENSION COMPARAISON METHODE ETUDE METALLOIDE COMPOSE MINERAL CRISTALLOGRAPHIE
- Keyword (en)
- SEMICONDUCTOR MATERIALS CRYSTAL DEFECT DEFECTS ELECTRON MICROSCOPY SCANNING MICROSCOPE TRANSMISSION MICROSCOPE HIGH VOLTAGE ELECTRON MICROSCOPE INVESTIGATION METHOD INORGANIC COMPOUND CRISTALLOGRAPHY
- Keyword (es)
- CRISTALOGRAFIA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7840188628
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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