CONSTANT INTENSITY CURVES IN CRITICAL SCATTERING AND VON LAUE DIAGRAMS
- Author
- KOCINSKI J
WARSAW TECH. UNIV., INST. PHYS.,WARSZAWA 00-662,POL - Source
- ACTA CRYSTALLOGR., SECT. A, CRYST. PHYS., DIFFR., THEOR. GEN. CRYSTALLOGR.; ISSN 0567-7394; DNK; DA. 1979; VOL. 35; NO 5; PP. 859; BIBL. 14 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- DIFFUSION RX METHODE LAUE DIFFUSION CRITIQUE INTENSITE MONOCRISTAL ETUDE THEORIQUE CRISTALLOGRAPHIE
- Keyword (en)
- X RAY SCATTERING LAUE METHOD CRITICAL SCATTERING INTENSITY SINGLE CRYSTAL THEORETICAL STUDY CRISTALLOGRAPHY
- Keyword (es)
- CRISTALOGRAFIA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8040094525
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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