COMPARISON OF SENSITIVITY COEFFICIENTS FOR SPARK-SOURCE MASS SPECTROMETRY DETERMINED WITH PHOTOGRAPHIC AND ELECTRICAL DETECTION
- Author
- VAN HOYE E; GIJBELS R; ADAMS F
UNIV. ANTWERP, DEP. CHEM.,WILRIJK 2610,BEL - Source
- ANAL. CHIM. ACTA; ISSN 0003-2670; NLD; DA. 1980; VOL. 115; PP. 239-248; BIBL. 18 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- SPECTROMETRIE MASSE ETINCELAGE ANALYSE CHIMIQUE SENSIBILITE ETUDE COMPARATIVE HAUTE FREQUENCE PHOTOGRAPHIE METHODE ELECTRIQUE DETECTEUR ACIER FER!SUB METAL!ANA CHIMIE ANALYTIQUE
- Keyword (en)
- MASS SPECTROMETRY MASS SPECTROSCOPY SPARK MACHINING CHEMICAL ANALYSIS CHEMICAL COMPOSITION SENSITIVITY COMPARATIVE STUDY HIGH FREQUENCY PHOTOGRAPHY ELECTRICAL METHODS DETECTOR STEEL ANALYTICAL CHEMISTRY
- Keyword (es)
- QUIMICA ANALYTICA
- Classification
- Discipline
- General chemistry and physical chemistry
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8060279074
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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