EDC CHIP BOOSTS MEMORY RELIABILITY
- Author
- TATE G; MILLER W
ADVANCED MICRO DEVICES INC./SUNNYVALE CA 94086/USA - Source
- ELECTRON. DESIGN; USA; DA. 1980; VOL. 28; NO 18; PP. 151-155; BIBL. 9 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- FIABILITE MEMOIRE CORRECTION ERREUR DETECTION ERREUR CIRCUIT INTEGRE FIABILITE SYSTEME PUCE INFORMATIQUE MATHEMATIQUES APPLIQUEES
- Keyword (en)
- RELIABILITY MEMORY ERROR CORRECTION ERROR DETECTION INTEGRATED CIRCUIT SYSTEM RELIABILITY CHIP COMPUTER SCIENCES APPLIED MATHEMATICS
- Keyword (es)
- INFORMATICA MATEMATICAS APPLICADAS
- Classification
- Pascal
- 001 Exact sciences and technology / 001A Sciences and techniques of general use / 001A02 Mathematics
- Discipline
- Mathematics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8130063559
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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