COMPARISON OF HOLLOW CONE AND AXIAL BRIGHT FIELD ELECTRON MICROSCOPE IMAGING TECHNIQUES
- Author
- FREEMAN LA; HOWIE A; MISTRY AB
CAVENDISH LAB./CAMBRIDGE/GBR - Source
- J. MICR.; GBR; DA. 1980; VOL. 119; NO 1; PP. 3-18; BIBL. 31 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- MICROSCOPIE ELECTRONIQUE MICROSCOPIE CHAMP CLAIR HAUTE RESOLUTION MATERIAU AMORPHE ETUDE COMPARATIVE CONTRASTE ILLUMINATION CONE CREUX ILLUMINATION AXIALE METROLOGIE PHYSIQUE THEORIQUE ELECTRONIQUE
- Keyword (en)
- ELECTRON MICROSCOPY HIGH-RESOLUTION METHODS AMORPHOUS MATERIAL COMPARATIVE STUDY CONTRAST MEASUREMENT SCIENCE THEORETICAL PHYSICS ELECTRONICS
- Keyword (es)
- METROLOGIA FISICA TEORICA ELECTRONICA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics
- Discipline
- Electronics Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8130068567
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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