LONG-RANGE ORDER AND DIFFRACTION OF X-RAY WAVES ON MULTILAYERED CRYSTALLINE FILMS
- Author
- FEIGELMAN M; POKROVSKY V
USSR ACAD. SCI., L. D. LANDAU INST. THEORET. PHYS./MOSCOW/SUN - Source
- J. PHYSIQUE; ISSN 0302-0738; FRA; DA. 1981; VOL. 42; NO 1; PP. 125-131; ABS. FRE; BIBL. 11 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- ETAT SMECTIQUE COUCHE MINCE DIMENSION EPAISSEUR ETUDE THEORIQUE CRISTAL LIQUIDE DIFFRACTION RX FACTEUR STRUCTURE SMECTIQUE B CRISTALLOGRAPHIE
- Keyword (en)
- SMECTIC STATE THIN FILM DIMENSIONS THICKNESS THEORETICAL STUDY LIQUID CRYSTALS X-RAY DIFFRACTION ANALYSIS STRUCTURE FACTOR CRISTALLOGRAPHY
- Keyword (es)
- CRISTALOGRAFIA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8130361043
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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