A DOUBLE-LINE IMAGE OF A DISLOCATION IN A SILICON SINGLE CRYSTAL OBSERVED BY X-RAY PLANE WAVE TOPOGRAPHY
- Author
- ISHIDA K; OOTUKA A; TAKAGI S
UNIV. TOKYO, DEP. PURE APPLIED SCI./MEGUROKU TOKYO/JPN - Source
- PHILOS. MAG., A; ISSN 0141-8610; GBR; DA. 1981; VOL. 43; NO 4; PP. 935-944; BIBL. 17 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- ANALYSE TOPOGRAPHIE RX MONOCRISTAL NON METAL ELEMENT GROUPE IVB VECTEUR BURGERS SIMULATION ORDINATEUR METHODE CALCUL DISLOCATION SILICIUM CRISTALLOGRAPHIE
- Keyword (en)
- SINGLE CRYSTAL NON METAL GROUP IVB ELEMENT BURGERS VECTOR COMPUTER SIMULATION CALCULATING METHOD DISLOCATION SILICON CRISTALLOGRAPHY
- Keyword (es)
- CRISTALOGRAFIA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8130409859
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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