CONSTANT-PSI CONSTANT-DELTA CONTOUR MAPS: APPLICATIONS TO ELLIPSOMETRY AND TO REFLECTION TYPE OPTICAL DEVICES
- Author
- ZAGHLOUL ARM; AZZAM RMA
CAIRO UNIV., ELECTR. ENG. DEP./CAIRO/EGY - Source
- APPL. OPT.; ISSN 0003-6935; USA; DA. 1982; VOL. 21; NO 4; PP. 739-743; BIBL. 6 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- COUCHE MINCE ELLIPSOMETRIE SUBSTRAT SILICIUM SILICIUM OXYDE LASER REFLEXION OPTIQUE SYSTEME OPTIQUE POLARISEUR DIAGRAMME CARTE EPAISSEUR ANGLE INCIDENCE CONTOUR DELTA CONSTANT CONTOUR PSI CONSTANT RETARDATEUR METROLOGIE PHYSIQUE THEORIQUE
- Keyword (en)
- THIN FILM ELLIPSOMETRY SILICON SILICON OXIDES LASER OPTICAL REFLECTION DIAGRAM MAPS THICKNESS ANGLE OF INCIDENCE MEASUREMENT SCIENCE THEORETICAL PHYSICS
- Keyword (es)
- METROLOGIA FISICA TEORICA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics
- Discipline
- Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL82X0200397
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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