MEASUREMENT OF MINORITY CARRIER LIFETIME IN GAAS AND GAAS1-XPX WITH AN INTENSITY-MODULATED ELECTRON BEAM
- Auteur
- PIETZSCH J
TECH. UNIV. MUENCHEN, LEHRSTUHL TECH. ELEKTRON./MUENCHEN 8000/DEU - Source
- SOLID-STATE ELECTRON.; ISSN 0038-1101; GBR; DA. 1982; VOL. 25; NO 4; PP. 295-304; BIBL. 25 REF.
- Type de document
- Article
- Langue
- English
- Mot clé (fr)
- PORTEUR CHARGE DUREE VIE DIFFUSION PORTEUR CHARGE PORTEUR MINORITAIRE COMPOSITION CHIMIQUE GALLIUM ARSENIURE GALLIUM PHOSPHOARSENIURE PHYSIQUE SOLIDE
- Mot clé (en)
- LIFETIME CHEMICAL COMPOSITION SOLID PHYSICS
- Mot clé (es)
- FISICA DEL ESTADO CONDENSADO
- Classification
- Pascal
- 001 Sciences exactes et technologie / 001B Physique / 001B60 Etat condense: structure, proprietes mecaniques et thermiques
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Provenance
- Inist-CNRS
- Base de données
- PASCAL
- Identifiant INIST
- PASCAL82X0220412
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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