MICROOPTIC DOUBLE BEAM SYSTEM FOR REFLECTANCE AND ABSORPTION MEASUREMENTS AT HIGH PRESSURE
- Author
- SYASSEN K; SONNENSCHEIN R
UNIV. DUESSELDORF, PHYS. INST. III/DUESSELDORF 4000/DEU - Source
- REV. SCI. INSTRUM.; ISSN 0034-6748; USA; DA. 1982; VOL. 53; NO 5; PP. 644-650; BIBL. 18 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- REFLEXION OPTIQUE COEFFICIENT REFLEXION ABSORPTION OPTIQUE MESURE HAUTE PRESSION CHAMBRE HAUTE PRESSION SOLIDE SPECTROMETRIE ABSORPTION SPECTROMETRIE REFLEXION SPECTROMETRIE OPTIQUE APPAREILLAGE ECHANTILLON PETIT METROLOGIE PHYSIQUE THEORIQUE
- Keyword (en)
- OPTICAL REFLECTION REFLECTANCE OPTICAL ABSORPTION MEASUREMENT HIGH PRESSURE HIGH PRESSURE CELL SOLID ABSORPTION SPECTROMETRY REFLECTION SPECTROMETRY OPTICAL SPECTROMETRY INSTRUMENTATION MEASUREMENT SCIENCE THEORETICAL PHYSICS
- Keyword (es)
- METROLOGIA FISICA TEORICA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics
- Discipline
- Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL82X0336276
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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