DETERMINATION OF THE PHASE OF COMPLEX ATOMIC SCATTERING AMPLITUDES FROM LIGHT-OPTICAL DIFFRACTOGRAMS OF ELECTRON MICROSCOPE IMAGES
- Author
- TYPKE D; RADERMACHER M
MAX-PLANCK-INST. BIOCHEM./MARTINSRIED 8033/DEU - Source
- ULTRAMICROSCOPY; ISSN 0304-3991; NLD; DA. 1982; VOL. 9; NO 1-2; PP. 131-138; BIBL. 24 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- ETUDE THEORIQUE DIFFRACTION OPTIQUE ETUDE EXPERIMENTALE COMPOSE BIOLOGIQUE TRAITEMENT IMAGE RECONSTRUCTION IMAGE MICROSCOPIE ELECTRONIQUE FACTEUR DIFFUSION ATOMIQUE PHASE AMPLITUDE CRISTALLOGRAPHIE
- Keyword (en)
- THEORETICAL STUDY OPTICAL DIFFRACTION EXPERIMENTAL STUDY BIOLOGICAL COMPOUND IMAGE PROCESSING IMAGE RECONSTRUCTION ELECTRON MICROSCOPY ATOMIC SCATTERING FACTOR AMPLITUDE PHASE CRISTALLOGRAPHY
- Keyword (es)
- CRISTALOGRAFIA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL83X0065477
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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