A NOVEL METHOD FOR MEASUREMENT OF THE CHANNEL LENGTH OF SHORT CHANNEL MOSFET'S
- Author
- OKUMURA K; MIYOSHI M
TOSHIBA CORP./KAWASAKI/JPN - Source
- J. ELECTROCHEM. SOC.; ISSN 0013-4651; USA; DA. 1982; VOL. 129; NO 6; PP. 1338-1342; BIBL. 5 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- TRANSISTOR EFFET CHAMP TRANSISTOR MOS CANAL TRANSISTOR METHODE MESURE LONGUEUR COURANT INDUIT FAISCEAU ELECTRONIQUE METHODE ELECTRIQUE JONCTION P N ELECTRONIQUE
- Keyword (en)
- FIELD EFFECT TRANSISTOR MOS TRANSISTOR TRANSISTOR CHANNEL MEASUREMENT METHOD LENGTH INDUCED CURRENT ELECTRON BEAM ELECTRICAL METHOD P N JUNCTION ELECTRONICS
- Keyword (es)
- ELECTRONICA
- Classification
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL83X0103924
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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