Pascal and Francis Bibliographic Databases

Help

Export

Selection :

Permanent link
http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=PASCAL83X0475229

MEASUREMENTS OF INTENSE ION BEAMS BY A NOVEL DIAGNOSTIC METHOD

Author
BLAUGRUND AE; STEPHANAKIS SJ; GOLDSTEIN SA
NAVAL RES. LAB./WASHINGTON DC 20375/USA
Source
JOURNAL OF APPLIED PHYSICS; ISSN 0021-8979; USA; DA. 1982; VOL. 53; NO 11; PART. 1; PP. 7280-7289; BIBL. 16 REF.
Document type
Article
Language
English
Keyword (fr)
ELECTRONIQUE
Keyword (en)
RADIO LINK ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL83X0475229

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

Searching the Web