au.\*:("DOHERTY JG")
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DETERMINATION OF THICKNESS AND REFRACTIVE INDEX OF THIN TRANSPARENT MULTILAYER FILMS ON SILICON FROM ELLIPSOMETRIC DATA.DOHERTY JG; RYAN WD.1975; PROC. INSTIT. ELECTR. ENGRS; G.B.; DA. 1975; VOL. 122; NO 10; PP. 1093-1094Article
