FAULT-SIMULATION METHODS - EXTENSIONS AND COMPARISONLEVENDEL YH; MENON PR.1981; BELL SYST. TECH. J.; ISSN 0005-8580; USA; DA. 1981; VOL. 60; NO 9; PP. 2235-2258; BIBL. 24 REF.Article

DEDUCTIVE FAULT SIMULATION WITH FUNCTIONAL BLOCKS = SIMULATION DEDUCTIVE DE FAUTES AVEC DES BLOCS FONCTIONNELSMENON PR; CHAPPELL SG.1978; I.E.E.E. TRANS. COMPUTERS; USA; DA. 1978; VOL. 27; NO 8; PP. 689-695; BIBL. 15 REF.Article

TOTALLY PRESET CHECKING EXPERIMENTS FOR SEQUENTIAL MACHINESLIN GK; MENON PR.1983; IEEE TRANSACTIONS ON COMPUTERS; ISSN 0018-9340; USA; DA. 1983; VOL. 32; NO 2; PP. 101-108; BIBL. 14 REF.Article

UNKNOWN SIGNAL VALUES IN FAULT SIMULATIONLEVENDEL YH; MENON PR.1979; FTCS-9.ANNUAL INTERNATIONAL SYMPOSIUM ON FAULT-TOLERANT COMPUTING. 9/1979/MADISON WI; USA; NEW YORK: IEEE; DA. 1979; PP. 125-132; BIBL. 5 REF.Conference Paper

SPECIAL-PURPOSE COMPUTER FOR LOGIC SIMULATION USING DISTRIBUTED PROCESSINGLEVENDEL YH; MENON PR; PATEL SM et al.1982; BELL SYSTEM TECHNICAL JOURNAL; ISSN 0005-8580; USA; DA. 1982; VOL. 61; NO 10; PART. 1; PP. 2873-2909; BIBL. 12 REF.Article

ACCURATE LOGIC SIMULATION MODELS FOR TTL TOTEMPOLE AND MOS GATES AND TRISTATE DEVICESLEVENDEL YL; MENON PR; MILLER CE et al.1981; BELL SYST. TECH. J.; ISSN 0005-8580; USA; DA. 1981; VOL. 60; NO 7; PART. 1; PP. 1271-1287; BIBL. 5 REF.Article

DECOMPOSITION OF ZIRCON BY SODA ASH SINTERING PROCESS = DECOMPOSITION DU ZIRCON PAR FRITTAGE AVEC DU CARBONATE DE SOUDE ANHYDREMENON PR; JUNEJA JM; KRISHNAN TS et al.1980; BULL.-AM. CERAM. SOC.; ISSN 0002-7812; USA; DA. 1980; VOL. 59; NO 6; PP. 635-645; 3 P.; BIBL. 7 REF.Article

A LOGIC SIMULATION MACHINEABRAMOVICI M; LEVENDEL YH; MENON PR et al.1982; ANNUAL SYMPOSIUM ON COMPUTER ARCHITECTURE. 9/1982-04-26/AUSTIN TX; USA; NEW YORK: IEEE; DA. 1982; PP. 148-157; BIBL. 18 REF.Conference Paper

DIGEST OF PAPERS: FTCS-9/9TH ANNUAL INTERNATIONAL SYMPOSIUM ON FAULT-TOLERANT COMPUTING, MADISON WI, JUNE 20-22, 1979MENON PR ED.1979; FTCS-9. ANNUAL INTERNATIONAL SYMPOSIUM ON FAULT-TOLERANT COMPUTING. 9/1979-06-20/MADISON WI; USA; NEW YORK: IEEE; DA. 1979; XII-235 P.: ILL.; 28 CMConference Proceedings