BLACK FAMILY PROBLEMS, ISOLATION AND SCHOOL WEAKNESSESSIKULA J. P.SOCIOLOGIA INTERNATIONALIS. 1973, Vol 11, Num 1-2, pp 117-124Article

DO BLACK AND WHITE UNIVERSITY INTERNS DIFFER IN THEIR BASIC VALUES?SIKULA J. P.JOURNAL (THE) OF NEGRO EDUCATION. 1975, Vol 44, Num 2, pp 200-207Article

Black Attitude toward Education and Schooling, a Case for American School ReformSIKULA J. P.Revista Internacional de Sociologia. 1976, Vol 34, Num 18-19-20, pp 135-143Article

ETUDE DE PHENOMENES STOCHASTIQUES DANS DES DIODES AU GAASSIKULA J.1974; ELEKTROTECH. CAS.; CESKOSL.; DA. 1974; VOL. 25; NO 4-6; PP. 312-318; ABS. RUSSE ALLEM. ANGL.; BIBL. 11 REF.Article

FLUCTUATIONS DU COURANT DANS LES CONTACTS DE DIODES AU GAPSIKULA J.1977; ELEKTROTECH. CAS.; CESKOSL.; DA. 1977; VOL. 28; NO 1; PP. 43-47; ABS. RUSSE ALLEM. ANGL.; BIBL. 6 REF.Article

METHOD OF EXPERIMENTAL STUDY OF FLUCTUATIONS IN SEMICONDUCTORSKOKTAVY B; SIKULA J.1979; ACTA PHYS. SLOV.; CSK; DA. 1979; VOL. 29; NO 3; PP. 227-236; ABS. RUS; BIBL. 8 REF.Article

TRANSPORT AND NOISE CHARACTERISTICS OF INSB INFRARED DETECTORSSIKULA J; VASINA P.1979; INTERNATIONAL SYMPOSIUM ON PHOTON-DETECTORS. 8/1978/PRAHA; HUN; BUDAPEST: IMEKO; DA. 1979; PP. 249-257; BIBL. 10 REF.Conference Paper

What Is Appropriate Historical Content in Black Studies CoursesSIKULA J. P; SIKULA R. R.Malaysian Journal of Education. 1975, Vol 12, Num 1-2, pp 69-72Article

STOCHASTIC CHARACTERISTICS OF THE BURST NOISEKOKTAVY B; SIKULA J; VASINA P et al.1980; ACTA PHYS. SLOV.; CSK; DA. 1980; VOL. 30; NO 2; PP. 163-169; ABS. RUS; BIBL. 7 REF.Article

DO TEACHERS DIFFER IN THEIR VALUES?SIKULA J. P; JURS S. G; SIKULA A. F et al.EDUC. URBAN SOC. 1972, Vol 4, Num 4, pp 459-466Article

Spark and glow DC-partial-discharges in dielectricsFICKER, T; SIKULA, J.Japanese journal of applied physics. 1984, Vol 23, Num 9, pp 1263-1264, issn 0021-4922, part 1Article

STOCHASTIC PHENOMENA IN EPITAXIAL P-N JUNCTIONS IN GAP.SIKULA J; KOKTAVY B; KRATENA L et al.1975; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1975; VOL. 29; NO 1; PP. 41-46; ABS. ALLEM.; BIBL. 10 REF.Article

Symmetrical current-voltage characteristic of a metal-semiconductor-metal structure of Schottky contacts and parameter retrieval of a CdTe structureELHADIDY, H; SIKULA, J; FRANC, J et al.Semiconductor science and technology. 2012, Vol 27, Num 1, issn 0268-1242, 015006.1-015006.6Article

Subtentorial subdural empyema : case reportTOTH, S; SZABO, S; KOLLAR, J et al.Surgical neurology. 1992, Vol 37, Num 3, pp 208-210, issn 0090-3019Article

Excess noise of the silicon surface barrier detectorsVOJTEK, J; SIKULA, J; TYKVA, R et al.Czechoslovak journal of physics. 1990, Vol 40, Num 11, pp 1289-1292, issn 0011-4626Article

Local avalanche breakdowns in semiconductor GaAsP diodesKOKTAVY, P; SIKULA, J; STOURAC, L et al.International conference on microelectronics. 2004, isbn 0-7803-8166-1, 2Vol, vol 2, 667-670Conference Paper

A low-frequency noise study of hot-carrier stressing effects in submicron Si p-MOSFETsVASINA, P; SIMOEN, E; CLAEYS, C et al.Microelectronics and reliability. 1998, Vol 38, Num 1, pp 23-27, issn 0026-2714Article

VYSKYT ASKARIOZY A TRICHURIOZY U9-11 LETYCH SKOLNICH DETI V SEVEROMORAUSKEM KRAJI = FREQUENCE DE L'ASCARIDIOSE ET DE LA TRICHURIASE, CHEZ LES ENFANTS SCOLARISES DE 9 A 11 ANS DANS LA MORAVIE DU NORDVOLNA L; ASMERA J; BABICKA C et al.1979; CESKOSL. EPIDEMIOL. MIKROBIOL. IMMUNOL.; CSK; DA. 1979; VOL. 28; NO 1; PP. 48-56; ABS. RUS/ENG; BIBL. 22 REF.Article

Investigation of excess 1 / f noise in CdTe single crystalsANDREEV, A; GRMELA, L; MORAVEC, P et al.Semiconductor science and technology. 2010, Vol 25, Num 5, issn 0268-1242, 055016.1-055016.7Article

Electromagnetic emission from polycrystalline solidsSIKULA, J; KOKTAVY, B; KOSIKOVA, I et al.Journal of acoustic emission. 1999, Vol 17, Num 3-4, pp S100-S107, issn 0730-0050Conference Paper

Are intra- and suprasellar masses detected by CT and MR really tumours ?TOTH, S; MIKO, L; KOLLAR, J et al.Acta neurochirurgica. 1995, Vol 137, Num 1-2, pp 54-57, issn 0001-6268Article

1/f Noise in GaAs Schottky diodesSIKULA, J; VASINA, P; MUSILOVA, V et al.Physica status solidi. A. Applied research. 1984, Vol 84, Num 2, pp 693-696, issn 0031-8965Article

Generation of 1/f spectrum by relaxation process in thin film resistors : Quality and reliability aspects of passive componentsHASHIGUCHI, S; YAMAGISHI, Y; FUKUDA, T et al.Quality and reliability engineering international. 1998, Vol 14, Num 2, pp 69-71, issn 0748-8017Conference Paper

Alterations of the connective tissue in nude miceGYARMATI, J. JR; MANDI, B; FACHET, J et al.Thymus. 1983, Vol 5, Num 5-6, pp 383-392, issn 0165-6090Article

Screening of vascular cognitive impairment on a Hungarian cohortSZATMARI, S; FEKETE, I; CSIBA, L et al.Psychiatry and clinical neurosciences (Carlton. Print). 1999, Vol 53, Num 1, pp 39-43, issn 1323-1316Article