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In-line metrology methods for manufacturing control of BiCMOS filmsPRINTY, Craig; SEMICONDUCTOR, National.IEEE / SEMI advanced semiconductor manufacturing conference. 2004, pp 348-354, isbn 0-7803-8312-5, 1Vol, 7 p.Conference Paper

Integration of power devices in advanced mixed signal analog BiCMOS technologyEFLAND, T. R.Microelectronics journal. 2001, Vol 32, Num 5-6, pp 409-418, issn 0959-8324Article

A 20GHz VCO with 5GHz tuning range in 0.25μm SiGe BiCMOSJUNG, B; HARJANI, R.IEEE International Solid-State Circuits Conference. 2004, pp 178-179, isbn 0-7803-8267-6, 2Vol, 2 p.Conference Paper

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Tiny op amp targets miniature portable electronicsBINDRA, A.Electronic design. 1998, Vol 46, Num 6, pp 40-46, issn 0013-4872, 4 p.Article

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Copper contamination effect on the reliability of devices in the BiCMOS technologyKIA SENG LOW; SCHWERD, M; KOERNER, H et al.SPIE proceedings series. 1999, pp 24-33, isbn 0-8194-3480-9Conference Paper

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