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CALCUL DE L'INFLUENCE DE LA CORRELATION DES DONNEES EXPERIMENTALES SUR LA MATRICE D'ERREURS DES PARAMETRES POUR LA DIFFRACTOMETRIE ELECTRONIQUE EN PHASE VAPEURANASHKIN MG; BERSHOV VA.1974; IZVEST. VYSSH. UCHEBN. ZAVED., KHIM. KHIM. TEKHNOL.; S.S.S.R.; DA. 1974; VOL. 17; NO 9; PP. 1319-1322; BIBL. 4 REF.Article

A LEED GONIOMETER.DE BERSUDER L.1974; REV. SCI. INSTRUM.; U.S.A.; DA. 1974; VOL. 45; NO 12; PP. 1569-1572; BIBL. 5 REF.Article

ABSORPTION EFFECT AND CONTRAST CHANGE OF KIKUCHI LINES IN REFLECTION PATTERNS.KAWAMURA T.1975; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1975; VOL. 27; NO 2; PP. 591-598; ABS. ALLEM.; BIBL. 17 REF.Article

ANALYSIS OF A SURFACE CRYSTALLOGRAPHY OF A SOLID: LEED AND RHEED TECHNIQUES.THEETEN JB.1975; ACTA ELECTRON.; FR.; DA. 1975; VOL. 18; NO 1; PP. 39-45; ABS. FR. ALLEM.; BIBL. 20 REF.Article

LA DIFFRACTION DES ELECTRONS LENTS: ESPOIRS ET LIMITES.ABERDAM D.1975; VIDE; FR.; DA. 1975; VOL. 30; NO 176; PP. 76-85; ABS. ANGL.; BIBL. 28 REF.Article

TECHNIQUE DE L'EXPERIENCE ET CALCUL DES TABLEAUX DE DIFFRACTION DES ELECTRONS LENTSGALAEV AA; PARKHOMENKO YU N; SAFONOV YU S et al.1975; ZAVODSK. LAB.; S.S.S.R.; DA. 1975; VOL. 41; NO 4; PP. 439-442; BIBL. 6 REF.Article

INFLUENCE DES ERREURS ALEATOIRES SUR LA DETERMINATION DES PARAMETRES MOLECULAIRES EN DIFFRACTION ELECTRONIQUE DES GAZ. LISSAGE DES COURBES MOLECULAIRES D'INTENSITEMASTRYUKOV VS; DOROFEEVA OV.1974; ZH. STRUKT. KHIM.; S.S.S.R.; DA. 1974; VOL. 15; NO 3; PP. 376-382; BIBL. 9 REF.Article

IMPROVED METHOD FOR LEED INTENSITY MEASUREMENTS.FELTER TE; ESTRUP PJ.1976; REV. SCI. INSTRUM.; U.S.A.; DA. 1976; VOL. 47; NO 1; PP. 158-160; BIBL. 5 REF.Article

ERROR ANALYSIS AND ADJUSTMENT OF THE LEED GONIOMETER.ABERDAM D; BAUDOING R; DE BERSUDER L et al.1974; REV. SCI. INSTRUM.; U.S.A.; DA. 1974; VOL. 45; NO 12; PP. 1573-1579; BIBL. 7 REF.Article

APPLICATION OF THE GRAIN-COUNTING TECHNIQUE TO ELECTRON DIFFRACTION EXPERIMENTS.TURMAN B; ANDERSEN P.1974; ACTA CHEM. SCAND., A; DANEM.; DA. 1974; VOL. 28; NO 2; PP. 229-232; BIBL. 6 REF.Article

ON THE INVESTIGATION OF SURFACE STRUCTURE BY REFLECTION HIGH ENERGY ELECTRON DIFFRACTION (RHEED)NIELSEN PEH.1973; SURF. SCI.; NETHERL.; DA. 1973; VOL. 35; PP. 194-210; BIBL. 26 REF.; (SOLID-VAC. INTERFACE. PROC. 2ND. SYMP. SURF. PHYS.; ENSCHEDE, NETH.; 1972)Conference Paper

A SIMPLE GEOMETRICAL INTERPRETATION OF THE SUPERSTRUCTURES RACP X RACP (P=3, 7, 19, 31, 49,...) OBSERVED ON SURFACES WITH HEXAGONAL SYMMETRY BY MEANS OF LEED AND RHEEDDE RIDDER R; VAN DYCK D; AMELINCKX S et al.1978; PHYS. STATUS SOLIDI, A; DDR; DA. 1978; VOL. 50; NO 1; PP. K67-K71; BIBL. 15 REF.Article

HIGH-RESOLUTION LOW-ENERGY ELECTRON DIFFRACTOMETER.WENDELKEN JF; PROPST FM.1976; REV. SCI. INSTRUM.; U.S.A.; DA. 1976; VOL. 47; NO 9; PP. 1069-1078; BIBL. 34 REF.Article

DISPOSITIF POUR L'ETUDE DE LA DIFFUSION D'ELECTRONS RAPIDES PAR LES MOLECULES D'UN GAZ POUR LE DIFFRACTOMETRE ELECTRONIQUE EHR-100BAZHANOV VI; RAMBIDI NG.1975; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1975; NO 6; PP. 234-235; BIBL. 1 REF.Article

PRECISION, COMBINED CRYSTAL-FARADAY CUP MANIPULATOR FOR LEED.DEBE MK.1976; REV. SCI. INSTRUM.; U.S.A.; DA. 1976; VOL. 47; NO 1; PP. 39-43; BIBL. 3 REF.Article

FAST LEED-INTENSITY MEASUREMENTS WITH A COMPUTER CONTROLLED TELEVISION SYSTEM.HEILMANN P; LANG E; HEINZ K et al.1976; APPL. PHYS.; GERM.; DA. 1976; VOL. 9; NO 3; PP. 247-251; BIBL. 2 REF.Article

A QUICK METHOD FOR IDENTIFYING ELECTRON DIFFRACTION PATTERNS.DE HAAN CD; KOLKMAN HJ.1974; J. PHYS. E; G.B.; DA. 1974; VOL. 7; NO 10; PP. 796-797Article

ELECTRON DIFFRACTION FROM AREAS LESS THAN 3 NM IN DIAMETER.GEISS RH.1975; APPL. PHYS. LETTERS; U.S.A.; DA. 1975; VOL. 27; NO 4; PP. 174-176; BIBL. 5 REF.Article

ON THE INVESTIGATION OF SURFACE STRUCTURE BY REFLECTION HIGH ENERGY ELECTRON DIFFRACTION (RHEED)NIELSEN PEH.1973; SURF. SCI.; NETHERL.; DA. 1973; VOL. 35; PP. 194-210; BIBL. 26 REF.; (SOLID-VAC. INTERFACE. PROC. 2ND. SYMP. SURF. PHYS.; ENSCHEDE, NETH.; 1972)Conference Paper

LA PREVISION DU DIAGRAMME DE DIFFRACTION ELECTRONIQUE D'UN MICROCRISTAL.LARROQUE P; BRIEU M; LAFOURCADE L et al.1976; C.R. ACAD. SCI., B; FR.; DA. 1976; VOL. 282; NO 14; PP. 309-312; BIBL. 12 REF.Article

ELECTRON DIFFRACTION FROM SINGLE, FULLY-HYDRATED, OX-LIVER CATALASE MICROCRYSTALS.DORSET DL; PARSONS DF.1975; ACTA CRYSTALLOGR., A; DANEM.; DA. 1975; VOL. 31; NO 2; PP. 210-215; H.T. 1; BIBL. 39 REF.Article

TECHNIQUE DE DEDUCTION DES MATRICES DES RELATIONS DE MACLAGE POUR L'ANALYSE DES FIGURES DE MICRODIFFUSION ELECTRONIQUE DES CRISTAUX DE SYMETRIES QUELCONQUESDZIGRASHVILI TA; KUTELIYA EH R; SANADZE VV et al.1975; KRISTALLOGRAFIJA; S.S.S.R.; DA. 1975; VOL. 20; NO 5; PP. 965-968; BIBL. 6 REF.Article

A CONTRIBUTION TO THE INDEXING OF TRANSMISSION ELECTRON DIFFRACTION PATTERNS.MESSERSCHMIDT A.1975; KRISTALL U. TECH.; DTSCH.; DA. 1975; VOL. 10; NO 4; PP. 455-460; ABS. ALLEM.; BIBL. 3 REF.Article

SYMMETRIZATION OF LOW-ENERGY ELECTRON DIFFRACTION PATTERNS.RUNDGREN J; SALWEN A.1974; J. PHYS. C; G.B.; DA. 1974; VOL. 23; NO 7; PP. 4247-4258; BIBL. 19 REF.Article

DETERMINATION PRECISE DES PARAMETRES CRISTALLINS PAR UNE METHODE D'AIRE SELECTIONNEEPILYANKEVICH OM; BYILODYIV RM.1974; DOP. AKAD. NAUK U.R.S.R., A; S.S.S.R.; DA. 1974; VOL. 36; NO 4; PP. 340-343; ABS. ANGL. RUSSE; BIBL. 8 REF.Article

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