kw.\*:("Depth")
Results 1 to 25 of 51828
Selection :
Analytical and numerical depth resolution functions in sputter profilingHOFMANN, S; LIU, Y; WANG, J. Y et al.Applied surface science. 2014, Vol 314, pp 942-955, issn 0169-4332, 14 p.Article
Improvement of depth resolution in XPS analysis of fluorinated layer using C60 ion sputteringNOBUTA, Takuya; OGAWA, Toshio.Applied surface science. 2010, Vol 256, Num 5, pp 1560-1565, issn 0169-4332, 6 p.Article
Depth scaling in phantom and monocular gap stereograms using absolute distance informationKUROKI, Daiichiro; NAKAMIZO, Sachio.Vision research (Oxford). 2006, Vol 46, Num 25, pp 4206-4216, issn 0042-6989, 11 p.Article
SIMS depth profiling of boron ultra shallow junctions using oblique O2+ beams down to 150 eVJUHEL, M; LAUGIER, F; DELILLE, D et al.Applied surface science. 2006, Vol 252, Num 19, pp 7211-7213, issn 0169-4332, 3 p.Conference Paper
Surface boundaries do not constrain a depth aftereffectVAN DER KOOIJ, K; DOMINI, F; TE PAS, S. F et al.Vision research (Oxford). 2011, Vol 51, Num 1, pp 138-146, issn 0042-6989, 9 p.Article
Accurate on-line depth calibration with a laser interferometer during SIMS profiling on the cameca IMS WF instrumentMERKULOV, A; MERKULOVA, O; DE CHAMBOST, E et al.Applied surface science. 2004, Vol 231-32, pp 954-958, issn 0169-4332, 5 p.Conference Paper
The accuracy of metric judgements: Perception of surface normalPORRILL, John; DUKE, Philip A; TAROYAN, Naira A et al.Vision research (Oxford). 2010, Vol 50, Num 12, pp 1140-1157, issn 0042-6989, 18 p.Article
A new approach to constructing optimal parallel prefix circuits with small depthLIN, Yen-Chun; HSIAO, Jun-Wei.Journal of parallel and distributed computing (Print). 2004, Vol 64, Num 1, pp 97-107, issn 0743-7315, 11 p.Article
Objective depth-of-focus is different from subjective depth-of-focus and correlated with accommodative microfluctuationsPEIJUN YAO; HUILING LIN; JIA HUANG et al.Vision research (Oxford). 2010, Vol 50, Num 13, pp 1266-1273, issn 0042-6989, 8 p.Article
Shave-off depth profiling : Depth profiling with an absolute depth scaleNOJIMA, M; MAEKAWA, A; YAMAMOTO, T et al.Applied surface science. 2006, Vol 252, Num 19, pp 7293-7296, issn 0169-4332, 4 p.Conference Paper
Deuterium depth profile quantification in a ASDEX Upgrade divertor tile using secondary ion mass spectrometryGHEZZI, F; CANIELLO, R; GIUBERTONI, D et al.Applied surface science. 2014, Vol 315, pp 459-466, issn 0169-4332, 8 p.Conference Paper
Inconsistency of perceived 3D shapeDI LUCA, M; DOMINI, F; CAUDEK, C et al.Vision research (Oxford). 2010, Vol 50, Num 16, pp 1519-1531, issn 0042-6989, 13 p.Article
SIMS depth profiling of deuterium labeled polymers in polymer multilayersHARTON, Shane E; STEVIE, Fred A; GRIFFIS, Dieter P et al.Applied surface science. 2006, Vol 252, Num 19, pp 7224-7227, issn 0169-4332, 4 p.Conference Paper
A monocular approach to depth maps generationHAO SHI; FAZEL NAGHDY; COOK, C. D et al.Computers in industry. 1994, Vol 25, Num 1, pp 15-30, issn 0166-3615Article
Heavy ion elastic recoil detection analysis of AlxOyfPt/AlxOy multilayer selective solar absorberNURU, Z. Y; MSIMANGA, M; ARENDSE, C. J et al.Applied surface science. 2014, Vol 298, pp 176-181, issn 0169-4332, 6 p.Article
Narrow surface transient and high depth resolution SIMS using 250 eV O2+AB RAZAK CHANBASHA; WEE, A. T. S.Applied surface science. 2006, Vol 252, Num 19, pp 7243-7246, issn 0169-4332, 4 p.Conference Paper
Visual constraints for the perception of quantitative depth from temporal interocular unmatched featuresRUI NI; LIN CHEN; ANDERSEN, George J et al.Vision research (Oxford). 2010, Vol 50, Num 16, pp 1571-1580, issn 0042-6989, 10 p.Article
Applications of SIMS to cultural heritage studiesADRIAENS, A; DOWSETT, M. G.Applied surface science. 2006, Vol 252, Num 19, pp 7096-7101, issn 0169-4332, 6 p.Conference Paper
Depth profiling of emerging materials for semiconductor devicesRONSHEIM, P. A.Applied surface science. 2006, Vol 252, Num 19, pp 7201-7204, issn 0169-4332, 4 p.Conference Paper
Temporal dynamics of stereo correspondence bi-stabilityGOUTCHER, Ross; MAMASSIAN, Pascal.Vision research (Oxford). 2006, Vol 46, Num 21, pp 3575-3585, issn 0042-6989, 11 p.Article
Influence of nonstationary atomic mixing on depth resolution in sputter depth profilingWANG, J. Y; LIU, Y; HOFMANN, S et al.Surface and interface analysis. 2012, Vol 44, Num 5, pp 569-572, issn 0142-2421, 4 p.Article
The pursuit theory of motion parallaxNAWROT, Mark; JOYCE, Lindsey.Vision research (Oxford). 2006, Vol 46, Num 28, pp 4709-4725, issn 0042-6989, 17 p.Article
Some applications of SIMS in conservation science, archaeometry and cosmochemistryMCPHAIL, D. S.Applied surface science. 2006, Vol 252, Num 19, pp 7107-7112, issn 0169-4332, 6 p.Conference Paper
Quantitative depth profiling of an alternating Pt/Co multilayer and a Pt-Co alloy multilayer by SIMS using a buckminsterfullerene (C60) sourceKYUNG JOONG KIM; SIMONS, David; GILLEN, Greg et al.Applied surface science. 2007, Vol 253, Num 14, pp 6000-6005, issn 0169-4332, 6 p.Article
Depth propagation and surface construction in 3-D visionGEORGESON, Mark A; YATES, Tim A; SCHOFIELD, Andrew J et al.Vision research (Oxford). 2009, Vol 49, Num 1, pp 84-95, issn 0042-6989, 12 p.Article