ELLIPSOMETRYKING RJ.1972; VACUUM; G.B.; DA. 1972; VOL. 22; NO 10; PP. 493-495; BIBL. 17 REF.Serial Issue

ELLIPSOMETRIE AVEC UN FAISCEAU DE LUMIERE CONVERGENTSVITASHEV KK; SEMENENKO AI; SEMENENKO LV et al.1973; OPT. I SPEKTROSK.; S.S.S.R.; DA. 1973; VOL. 34; NO 5; PP. 941-946; BIBL. 2 REF.Serial Issue

REALISATION ET MISE EN OEUVRE D'UN ELLIPSOMETRE DYNAMIQUE = PREPARATION AND USE OF A DYNAMIC ELLIPSOMETERFERRE MICHEL.1979; ; FRA; DA. 1979; 185 P.; 30 CM; BIBL. 27 REF.; TH. DOCT.-ING./TOULOUSE 3/1979/666Thesis

EQUI-INTENSITY SPECTROSCOPIC ELLIPSOMETRY WITH IMPERFECT OPTICAL COMPONENTSJUNGK G.1983; INFRARED PHYSICS; ISSN 0020-0891; GBR; DA. 1983; VOL. 23; NO 1; PP. 1-8; BIBL. 13 REF.Article

AUTOMATED LASER INTERFEROMETRIC ELLIPSOMETRY AND PRECISION REFLECTOMETRYHAZEBROEK HF; VISSER WM.1983; JOURNAL OF PHYSICS E: SCIENTIFIC INSTRUMENTS; ISSN 0022-3735; GBR; DA. 1983; VOL. 16; NO 7; PP. 654-661; BIBL. 5 REF.Article

CRITICAL ASSESSMENT AND MODIFICATION OF ROBINSON'S METHOD FOR THE ELLIPSOMETRIC INVESTIGATION OF THIN FILM MATERIALSKRUMME JP; HABERKAMP J.1972; THIN SOLID FILMS; NETHERL.; DA. 1972; VOL. 13; NO 2; PP. 335-339; BIBL. 9 REF.Serial Issue

MESURE DES CONSTANTES OPTIQUES DES LIMITES DE SEPARATION DE DEUX MILIEUXARTAMONOV OM; ASALKHANOV YU I.1973; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1973; NO 1; PP. 198-201; BIBL. 7 REF.Serial Issue

ELLIPSOMETRY IN CORROSION TECHNOLOGYHAYFIELD P.1972; ADV. CORROS. SCI. TECHNOL.; U.S.A.; DA. 1972; VOL. 2; PP. 43-113; BIBL. 4 P.Serial Issue

THE FIXED-POLARIZER NULLING SCHEME IN GENERALIZED ELLIPSOMETRYAZZAM RMA; BUNDY TL; BASHARA NM et al.1973; OPTICS COMMUNIC.; NETHERL.; DA. 1973; VOL. 7; NO 2; PP. 110-115; BIBL. 6 REF.Serial Issue

MEASUREMENT OF THE GROWTH OF SUB-MICROSCOPIC FATIGUE CRACKS BY ELLIPSOMETRYSMITH T.1974; SURF. SCI.; NETHERL.; DA. 1974; VOL. 45; NO 1; PP. 117-127; BIBL. 11 REF.Article

CHOICE OF CRITERIA FOR ELLIPSOMETRIC DETERMINATIONS ON THIN FILMSCAMAGNI P; MANARA A.1972; THIN SOLID FILMS; NETHERL.; DA. 1972; VOL. 13; NO 2; PP. 341-350; BIBL. 14 REF.Serial Issue

INTERNAL REFLECTION ELLIPSOMETRY FOR METAL DEPOSITSCHAN EC; MARTON JP.1972; J. APPL. PHYS.; U.S.A.; DA. 1972; VOL. 43; NO 10; PP. 4027-4030; BIBL. 11 REF.Serial Issue

ELLIPSOMETRIC MEASUREMENTS OF THE BARRIER LAYER IN COMPOSITE ALUMINUM OXIDE FILMS.DYER CK; ALWITT RS.1978; ELECTROCHIM. ACTA; G.B.; DA. 1978; VOL. 23; NO 4; PP. 347-354; BIBL. 22 REF.Article

THE ANODIC OXIDATION OF IRON: OVERPOTENTIAL ANALYSIS FOR A TWO-PHASE FILM.ORD JL; DE SMET DJ.1976; J. ELECTROCHEM. SOC.; U.S.A.; DA. 1976; VOL. 123; NO 12; PP. 1876-1882; BIBL. 29 REF.Article

RU ELECTRODE ELLIPSOMETRYVELIKODNYJ LN; SHEPELIN VA; KASATKIN EH V et al.1982; ELEKTROHIMIJA; ISSN 0424-8570; SUN; DA. 1982; VOL. 18; NO 9; PP. 1275-1280; BIBL. 11 REF.Article

ETUDE ELLIPSOMETRIQUE DE COUCHES D'OXYDES SUR DE L'ALUMINIUM ET SUR DES ALLIAGES ALUMINIUM-MAGNESIUMGOPIENKO VG; GRISHIN LG; LITVINOV VF et al.1977; FIZIKO-KHIMICHESKIE ISSLEDOVANIYA V TEKHNOLOGICHESKIKH PROTSESSAKH; MEZHVUZOVSKIJ SBORNIK; SUN; LENINGRAD: LENINGRADSKIJ POLITEKH. INST.; DA. 1977; PP. 3-9; BIBL. 6 REF.Book Chapter

EFFECTS OF TEMPERATURE ON THE KINETICS OF PASSIVE FILM GROWTH ON IRONLUKAC C; LUMSDEN JB; SMIALOWSKA S et al.1975; J. ELECTROCHEM. SOC.; U.S.A.; DA. 1975; VOL. 122; NO 12; PP. 1571-1579; BIBL. 18 REF.Article

QUELQUES ASPECTS DE L'ADOPTION DE LA METHODE ELLIPSOMETRIQUE A L'ETUDE DES PROCESSUS DE CORROSIONMOISIL D; ANGHELESCU D; MITAN D et al.1978; REV. CHIM.; ROMAN.; DA. 1978; VOL. 29; NO 1; PP. 63-66; ABS. ANGL.; BIBL. 9 REF.Article

ELLIPSOMETRIC STUDY OF FILM FORMATION ON IRON IN SODIUM SULPHATE SOLUTIONS IN THE PH RANGE 6-12SZKLARSKA SMIALOWSKA S; MROWCZYNSKI G.1976; BRIT. CORROS. J.; G.B.; DA. 1976; VOL. 10; NO 4; PP. 187-191; BIBL. 13 REF.Article

Improvement in accuracy of spectroscopic ir ellipsometry by the use of ir retardersRÖSELER, A; MOLGEDEY, W.Infrared physics. 1984, Vol 24, Num 1, pp 1-5, issn 0020-0891Article

Eine Anordnung zur spektrophotometrischen Ellipsometrie = Un montage pour l'ellipsométrie spectrophotométrique = A mounting for spectrophotometric ellipsometryABRAHAM, M; MAHMOUDI, A; TADJEDDINE, A et al.Experimentelle Technik der Physik. 1984, Vol 32, Num 5, pp 405-412, issn 0014-4924Article

USE OF AN ADP FOUR-CRYSTAL ELECTROOPTIC MODULATOR IN ELLIPSOMETRYMORITANI A; OKUDA Y; NAKAI J et al.1983; APPLIED OPTICS; ISSN 0003-6935; USA; DA. 1983; VOL. 22; NO 9; PP. 1329-1336; BIBL. 21 REF.Article

ETUDE ELLIPSOMETRIQUE DE L'OXYDATION DU TITANEAKIMOV AG; ANDREEVA NP; ROZENFEL'D IL et al.1978; ELEKTROKHIMIJA; SUN; DA. 1978; VOL. 14; NO 9; PP. 1391-1393; BIBL. 8 REF.Article

CALCULATION OF THE ELLIPSOMETRIC PARAMETERS CHARACTERIZING A RANDOMLY ROUGH SURFACE BY MEANS OF THE STRATTON-CHU-SILVER INTEGRALOHLIDAL I; LUKES F.1973; OPT. COMMUNIC.; NETHERL.; DA. 1973; VOL. 7; NO 1; PP. 76-79; BIBL. 8 REF.Serial Issue

PRINCIPAL ANGLE SPECTROSCOPIC ELLIPSOMETRY UTILIZING A ROTATING ANALYZERCHANDLER HOROWITZ D; CANDELA GA.1982; APPL. OPT.; ISSN 0003-6935; USA; DA. 1982; VOL. 21; NO 16; PP. 2972-2977; BIBL. 15 REF.Article