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ETUDE ELLIPSOMETRIQUE DE L'OXYDATION DU TITANEAKIMOV AG; ANDREEVA NP; ROZENFEL'D IL et al.1978; ELEKTROKHIMIJA; SUN; DA. 1978; VOL. 14; NO 9; PP. 1391-1393; BIBL. 8 REF.Article

Improvement in accuracy of spectroscopic ir ellipsometry by the use of ir retardersRÖSELER, A; MOLGEDEY, W.Infrared physics. 1984, Vol 24, Num 1, pp 1-5, issn 0020-0891Article

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Proper choice of the error function in modeling spectroellipsometric dataKIM, S. Y; VEDAM, K.Applied optics. 1986, Vol 25, Num 12, pp 2013-2021, issn 0003-6935Article

ELLIPSOMETRIC ANALYSES OF CHANGES IN SURFACE OXIDE FILMS ON NB DURING CATHODIC AND ANODIC POLARISATIONMATSUDA S; SUGIMOTO K.1981; NIPPON KINZOKU GAKKAISHI (1952); ISSN 0021-4876; JPN; DA. 1981; VOL. 45; NO 2; PP. 203-209; ABS. ENG; BIBL. 17 REF.Article

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CHARACTERIZATION OF SI SURFACE BY ELLIPSOMETRYOHIRA F; ITAKURA M.1979; BULL. JAP. SOC. PRECIS. ENGNG; JPN; DA. 1979; VOL. 13; NO 3; PP. 152-154Article

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ELLIPSOMETRIC STUDIES ON IRON OXIDE FILM GROWTH AT 100 TO 350 C.SZKLARSKA SMIALOWSKA Z; JUREK J.1976; CORROSION; U.S.A.; DA. 1976; VOL. 32; NO 7; PP. 294-297; BIBL. 11 REF.Article

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