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Zur optischen Messung der Oberflaechenrauheit = Optical measurement of the surface roughnessSCHMIDT, K.Feingerätetechnik. 1986, Vol 35, Num 10, pp 446-447, issn 0014-9683Article

Application of bidirectional ellipsometry to the characterization of roughness and defects in dielectric layersGERMER, T. A.SPIE proceedings series. 1998, pp 121-131, isbn 0-8194-2714-4Conference Paper

Measurement on roughness of optical surface by focal plane CCD cameraJIANBAI LI; XIAOYUN LI; AIHAN YING et al.SPIE proceedings series. 1998, pp 84-87, isbn 0-8194-2714-4Conference Paper

Thickness and roughness measurements in poly(o-methoxyaniline) layer-by-layer films using AFMRAPOSO, M; LOBO, R. F. M; PEREIRA-DA-SILVA, M. A et al.International symposium on electrets. 1999, pp 533-536, isbn 0-7803-5025-1Conference Paper

Examination of several novel approaches for the measurement of two-dimensional roughness of sidewalls of high aspect ratio patterns using the Atomic Force MicroscopeKINGSLEY, J. R; PLANO, R. J; GORDON CHAO, K.-J et al.SPIE proceedings series. 1998, pp 508-517, isbn 0-8194-2777-2Conference Paper

Form measurement inside fuel injector nozzle spray holesPEINER, Erwin; BALKE, Michael; DOERING, Lutz et al.Microelectronic engineering. 2009, Vol 86, Num 4-6, pp 984-986, issn 0167-9317, 3 p.Conference Paper

Surface roughness measurement using spatial-average analysis of objective speckle pattern in specular directionXUEZENG ZHAO; ZHAO GAO.Optics and lasers in engineering. 2009, Vol 47, Num 11, pp 1307-1316, issn 0143-8166, 10 p.Article

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Metrology methods for the quantification of edge-roughnessNELSON, C. M; PALMATEER, S. C; LYSZCZARZ, T et al.SPIE proceedings series. 1998, pp 19-29, isbn 0-8194-2777-2Conference Paper

Das Pruefen technischer Oberflaechen = Inspection of technical surfacesSACHS, G.Blech, Rohre, Profile. 1982, Vol 29, Num 5, pp 215-218, issn 0006-4688Article

Oberflächenmesstechnik für Labor und Produktion = Surface measurement for laboratory and productionFRIES, T.VDI-Berichte. 2003, pp 217-225, issn 0083-5560, isbn 3-18-091806-3, 9 p.Conference Paper

Scattering from normal incidence EUV opticsGULLIKSON, E. M.SPIE proceedings series. 1998, pp 72-80, isbn 0-8194-2776-4Conference Paper

An optical method for profilometry = Ein optisches Verfahren zur RauhigkeitsmessungBABU RAO, C; BALDEV, R; BHATTACHARYA, D.K et al.Experimental techniques (Westport, CT). 1985, Vol 9, Num 12, pp 31-34, issn 0732-8818Article

Surface roughness measurement by digital holographyLI YAN; WANG DAYONG; ZHAO JIE et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7656, issn 0277-786X, isbn 978-0-8194-8086-6, 76560X.1-76560X.8, 3Conference Paper

Roughness measurement of metallic surfaces based on the laser speckle contrast methodLEONARD, L. C; TOAL, V.Optics and lasers in engineering. 1998, Vol 30, Num 5, pp 433-440, issn 0143-8166Article

Electrostatically actuated stylus profiler with capacitive displacement sensing in vertical and lateral directionsKEARNY, M; FURMAN, B. J.SPIE proceedings series. 1998, pp 20-25, isbn 0-8194-2714-4Conference Paper

Nanometer-level metrology with a low-voltage CD-SEMYOSHIMURA, T; EZUMI, M; OTAKA, T et al.SPIE proceedings series. 1998, pp 61-70, isbn 0-8194-2777-2Conference Paper

X-ray scanner for the visualization of the spatial distribution of nanometer scale roughnessPROTOPOPOV, V. V; VALIEV, K. A; IMAMOV, R. M et al.SPIE proceedings series. 1998, pp 65-72, isbn 0-8194-2714-4Conference Paper

Multiparameter representation of surface roughness = Mehrparameterdarstellung der OberflaechenrauhigkeitNOWICKI, B.Wear. 1985, Vol 102, Num 3, pp 161-176, issn 0043-1648Article

Compact goniometer-ellipsometer for studying surface roughnessSHAJKEVICH, I.A; DROZD, P.I; POPERENKO, L.V et al.Zavodskaâ laboratoriâ. 1985, Vol 51, Num 7, pp 35-36, issn 0321-4265Article

Messrechner im Umfeld von Industrierobotern = Computer and industrial robotsTERWISSEN, B; FREUDENBERG, R; MOLITOR, M et al.Industrie-Anzeiger. 1984, Vol 106, Num 75, pp 37-40, issn 0019-9036Article

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Analyse der Hautrauhigkeit bei Personen unterschiedlicher Altersgruppeen mit dem Visiometer: ein neuartiges EDV-gestütztes Messverfahren = Analysis of skin roughness in persons of different age with the visiometer. A new computer-Assisted methodFLUHR, J. W; GEHRING, W; GLOOR, M et al.Aktuelle Dermatologie. 1995, Vol 21, Num 5, pp 151-156, issn 0340-2541Article

Development of a goniometric light scatter instrument with sample imaging abilityZERRAD, Myriam; LEQUIME, Michel; DEUMIE, Carole et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7102, pp 710207.1-710207.15, issn 0277-786X, isbn 978-0-8194-7332-5 0-8194-7332-4, 1VolConference Paper