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Estimation of delay variations due to random-dopant fluctuations in nanoscale CMOS circuitsMAHMOODI, Hamid; MUKHOPADHYAY, Saibal; ROY, Kaushik et al.IEEE journal of solid-state circuits. 2005, Vol 40, Num 9, pp 1787-1796, issn 0018-9200, 10 p.Conference Paper
