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Integrating intrinsic parameter fluctuation description into BSIMSOI to forecast sub-15 nm UTB SOI based 6T SRAM operationSAMSUDIN, K; CHENG, B; BROWN, A. R et al.Solid-state electronics. 2006, Vol 50, Num 1, pp 86-93, issn 0038-1101, 8 p.Conference Paper
