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Microstructural defect characterisation of a-Si:H deposited by low temperature HW-CVD on paper substratesBRITTON, D. T; HITTING, M; KNOESEN, D et al.Thin solid films. 2006, Vol 501, Num 1-2, pp 79-83, issn 0040-6090, 5 p.Conference Paper
