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The invariance of characteristic current densities in nanoscale MOSFETs and its impact on algorithmic design methodologies and design porting of Si(Ge) (Bi)CMOS high-speed building blocksDICKSON, Timothy O; YAU, Kenneth H. K; CHALVATZIS, Theodoros et al.IEEE journal of solid-state circuits. 2006, Vol 41, Num 8, pp 1830-1845, issn 0018-9200, 16 p.Conference Paper
