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Analysis by using X-ray photoelectron spectroscopy for polymethyl methacrylate and polytetrafluoroethylene etched by KrF excimer laserZHU, X. L; LIU, S. B; MAN, B. Y et al.Applied surface science. 2007, Vol 253, Num 6, pp 3122-3126, issn 0169-4332, 5 p.Article
