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Spectral and quantum chemical examination of the Si clusters nascent inside the SiO bulkKHAVRYUCHENKO, O. V; KHAVRYUCHENKO, V. D; ROSZINSKI, J. O et al.Thin solid films. 2006, Vol 515, Num 4, pp 1280-1285, issn 0040-6090, 6 p.Article
