18666395
Results 1 to 1 of 1
Selection :
Interfacial trap characteristics in depletion mode GaAs MOSFETsLEE, T. C; CHAN, C. Y; TSAI, P. J et al.Journal of crystal growth. 2007, Vol 301-302, pp 1009-1012, issn 0022-0248, 4 p.Conference Paper