18790334
Results 1 to 1 of 1
Selection :
Channel hot carrier effects in n-MOSFET devices of advanced submicron CMOS technologiesLA ROSA, Giuseppe; RAUCH, Stewart E.Microelectronics and reliability. 2007, Vol 47, Num 4-5, pp 552-558, issn 0026-2714, 7 p.Conference Paper
