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Modeling of strained CMOS on disposable SiGe dots : Shape impacts on electrical/thermal characteristicsFRDGONBSE, Sébastien; YAN ZHUANG; BURGHARTZ, Joachim N et al.Solid-state electronics. 2008, Vol 52, Num 6, pp 919-925, issn 0038-1101, 7 p.Article
