21798520
Results 1 to 1 of 1
Selection :
A CMOS circuit for evaluating the NBTI over a wide frequency rangeFERNANDEZ-GARCIA, R; KACZER, B; GROESENEKEN, G et al.Microelectronics and reliability. 2009, Vol 49, Num 8, pp 885-891, issn 0026-2714, 7 p.Article