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Electron subband structure in strained silicon UTB films from the Hensel-Hasegawa-Nakayama model - Part 1 analytical consideration and strain-induced valley splittingWINDBACHER, Thomas; SVERDLOV, Viktor; BAUMGARTNER, Oskar et al.Solid-state electronics. 2010, Vol 54, Num 2, pp 137-142, issn 0038-1101, 6 p.Article
