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Analysis of Phase Noise Degradation Considering Switch Transistor Capacitances for CMOS Voltage Controlled Oscillators : Analog Circuits and Related SoC Integration TechnologiesMURAKAMI, Rui; HARA, Shoichi; OKADA, Kenichi et al.IEICE transactions on electronics. 2010, Vol 93, Num 6, pp 777-784, issn 0916-8524, 8 p.Article
