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ESD Protection Design for 60-GHz LNA With Inductor-Triggered SCR in 65-nm CMOS ProcessLIN, Chun-Yu; CHU, Li-Wei; KER, Ming-Dou et al.IEEE transactions on microwave theory and techniques. 2012, Vol 60, Num 3, pp 714-723, issn 0018-9480, 10 p., 2Article
